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#! /bin/bash
# SPDX-License-Identifier: GPL-2.0
# Copyright (c) 2015 Samsung Electronics. All Rights Reserved.
#
# FS QA Test No. generic/063
#
# Delayed allocation multi insert range tests
# This testcase is one of the 4 testcases which tries to
# test various corner cases for finsert range functionality over different
# type of extents. These tests are based on generic/255 test case.
# For the type of tests, check the description of _test_generic_punch
# in common/rc.
. ./common/preamble
_begin_fstest auto quick prealloc punch insert fiemap
# Import common functions.
# we need to include common/punch to get defination fo filter functions
. ./common/filter
. ./common/punch
# real QA test starts here
_supported_fs generic
_require_xfs_io_command "fpunch"
_require_xfs_io_command "falloc"
_require_xfs_io_command "fiemap"
_require_xfs_io_command "finsert"
testfile=$TEST_DIR/$seq.$$
_test_generic_punch -d -k falloc fpunch finsert fiemap _filter_hole_fiemap $testfile
_check_test_fs
status=0
exit
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